Reliability
and failure analysis
of optoelectronics devices
(updated 2010.11.02)
(M. Meneghini, M. Vanzi, G. Meneghesso, and E. Zanoni)
Speaker: Matteo Meneghini,
DEI,
University
of Padova, Italy
Reliability issues
of
photovoltaic devices and systems
Part I -
Part II
(F. Roca and G. Graditi)
Speakers: Francesco Roca and Giorgio Graditi,
ENEA Portici
Technical Unit for Solar Energy applications, Italy
Hot Carrier Degradation
issues in
advanced CMOS nodes
(A. Bravaix)
Speaker: Alain Bravaix,
High
Institute for Electronics and Numerics, France
Reliability issues
of current and emerging non-volatile memories
(A. S. Spinelli, C. Monzio Compagnoni, D. Ielmini)
Speaker: Alessandro Spinelli,
DEI,
Polytechnic University of Milano, Italy